Workshop details

The meeting will focus on the applications of Raman spectroscopy and its ability to solve analytical problems. There will also be live demonstrations of Renishaw's cutting-edge Raman technology.                   

The topics covered in demos and by our invited speakers will include:

• Pushing the diffraction limit with Raman imaging
• Integrated AFM-Raman
• Combining Raman with other techniques
• Advanced analysis of Raman imaging data

The application areas to be discussed by our speakers will include:

• Nano and micro-structure                                       
• Geological
• Semiconductors

The sessions will be suitable for existing users as well as those who want to explore the potential of this powerful spectroscopic technique.

The workshop will be run in an informal style to encourage questions, networking and a free exchange of knowledge and ideas.

Schedule

9:45 – 10:00    Registration

10:00 – 10:10  Welcome,  Renishaw introduction – opening of workshop
Josef Sedlmeier – Renishaw s.r.o

10:10 – 10:40  Imaging graphene with the inVia, large and high resolution analysis
Tim Smith (video) – Renishaw plc & Josef Sedlmeier – Renishaw s.r.o.

10:40 – 11:10  Raman inspiration + latest developments at Renishaw
Josef Sedlmeier – Renishaw s.r.o.

11:10 – 11:20  Worked example – data analysis of graphene sample
Josef Sedlmeier – Renishaw s.r.o

11:20 – 11:30  Break

11:30 – 11:50  Raman spectroscopy of microcrystalline Si layers
Dr. Martin Ledinsky – Institute of Physics, Academy of science of the Czech Republic

11:50 – 12:10  Raman spectroscopy of polyaniline-Silver nanocomposite
Dr. Miroslava Trchova – Institute of macromolecular chemistry, Academy of science of the Czech Republic

12:10 – 12:30  Depolarization effects in microraman spectroscopy
Ing. Ivan Gregora, Csc. – Institute of Physics, Academy of science of the Czech Republic

12:30 – 13:30  Lunch break

13:30 – 13:45  inVia automation, Renishaw HSES stage and accessories, voice control
Tim Smith (video) – Renishaw plc & Josef Sedlmeier – Renishaw s.r.o.

13:45 – 14:00  Question and answer session
Tim Smith (remote link) – Renishaw plc and Josef Sedlmeier – Renishaw s.r.o.

14:00– 14:30  AFM-Raman studies of modern nanostructures
Dr. Pavel Dorozhkin – NT-MDT Co.

14:30 – 15:00  Coffee break

15:00 – 15:20  Raman adventures
Dr. Duncan Stacey –  Renishaw plc

15:20 – 15:40  Raman spectroscopy in Geology
Prof. Jan Jehlička – Faculty of Sciences, Charles University

15:40 – 16:30  Conclusion, discussion with customers

Live sample analysis

There will be opportunity to see and learn about the latest Raman collection and data analysis techniques during the Raman workshop (27th January).

Space for the extended demonstration on the 28th January is strictly limited. It is essential that you register for this seperately.

Please see Extended demonstration details for more information.